Texas Instruments SCANSTA111MT/NOPB, 7-Bit Addressable Scan Port, 3 → 3.6 V, 48-Pin TSSOP
Tehnička dokumentacija
Tehnički podaci
Proizvođač
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Mounting Type
Surface Mount
Package Type
TSSOP
Pin Count
48
Dimensions
12.6 x 6.2 x 1.05mm
Length
12.6mm
Width
6.2mm
Height
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+85 °C
Minimum Operating Supply Voltage
3 V
Minimum Operating Temperature
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Operating Temperature Range
-40 → +85 °C
Detalji o proizvodu
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
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P.O.A.
38
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Tehnička dokumentacija
Tehnički podaci
Proizvođač
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Mounting Type
Surface Mount
Package Type
TSSOP
Pin Count
48
Dimensions
12.6 x 6.2 x 1.05mm
Length
12.6mm
Width
6.2mm
Height
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+85 °C
Minimum Operating Supply Voltage
3 V
Minimum Operating Temperature
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Operating Temperature Range
-40 → +85 °C
Detalji o proizvodu
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
Zamisliti. Stvoriti. Surađivati
PRIDRUŽITE SE BESPLATNO
Bez skrivenih naknada!
- Preuzmite i koristite naš softver DesignSpark za svoje PCB i 3D mehaničke dizajne
- Pregledajte i doprinesite sadržaju internet stranice i foruma
- Preuzmite 3D modele, sheme i otiske s više od milijun proizvoda