Texas Instruments SCANSTA111MT/NOPB, 7-Bit Addressable Scan Port, 3 → 3.6 V, 48-Pin TSSOP

RS kataloški broj:: 162-6646robna marka: Texas InstrumentsProizvođački broj:: SCANSTA111MT/NOPB
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Tehnička dokumentacija

Tehnički podaci

Proizvođač

Texas Instruments

Number of Element Inputs

7

Number of Elements per Chip

1

Mounting Type

Surface Mount

Package Type

TSSOP

Pin Count

48

Dimensions

12.6 x 6.2 x 1.05mm

Length

12.6mm

Width

6.2mm

Height

1.05mm

Maximum Operating Supply Voltage

3.6 V

Maximum Operating Temperature

+85 °C

Minimum Operating Supply Voltage

3 V

Minimum Operating Temperature

-40 °C

Operating Supply Voltage Range

3 → 3.6 V

Operating Temperature Range

-40 → +85 °C

Detalji o proizvodu

Addressable JTAG Port, Texas Instruments

The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.

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P.O.A.

Texas Instruments SCANSTA111MT/NOPB, 7-Bit Addressable Scan Port, 3 → 3.6 V, 48-Pin TSSOP

P.O.A.

Texas Instruments SCANSTA111MT/NOPB, 7-Bit Addressable Scan Port, 3 → 3.6 V, 48-Pin TSSOP
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Tehnička dokumentacija

Tehnički podaci

Proizvođač

Texas Instruments

Number of Element Inputs

7

Number of Elements per Chip

1

Mounting Type

Surface Mount

Package Type

TSSOP

Pin Count

48

Dimensions

12.6 x 6.2 x 1.05mm

Length

12.6mm

Width

6.2mm

Height

1.05mm

Maximum Operating Supply Voltage

3.6 V

Maximum Operating Temperature

+85 °C

Minimum Operating Supply Voltage

3 V

Minimum Operating Temperature

-40 °C

Operating Supply Voltage Range

3 → 3.6 V

Operating Temperature Range

-40 → +85 °C

Detalji o proizvodu

Addressable JTAG Port, Texas Instruments

The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.