Tehnička dokumentacija
Tehnički podaci
Brand
KeithleySeries
2600
Source Meter Function
Current Resistance Voltage Measure, Current Voltage Source
Number of Channels
2
Source Voltage Range
±100 mV → ±40 V
Source Current Range
±100 nA → ±10 A
Output Power
40 W
Resistance Measurement Range
500 nΩ → 40 TΩ
Zemlja podrijetla
China
Detalji o proizvodu
Keithley Source Meter Series 2600B
Series 2600B Source Meter current/voltage source and measurement instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B Source Meter models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.
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Tehnička dokumentacija
Tehnički podaci
Brand
KeithleySeries
2600
Source Meter Function
Current Resistance Voltage Measure, Current Voltage Source
Number of Channels
2
Source Voltage Range
±100 mV → ±40 V
Source Current Range
±100 nA → ±10 A
Output Power
40 W
Resistance Measurement Range
500 nΩ → 40 TΩ
Zemlja podrijetla
China
Detalji o proizvodu
Keithley Source Meter Series 2600B
Series 2600B Source Meter current/voltage source and measurement instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B Source Meter models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.